BRAND : HEIDENHAIN
Scanning head | AK ERO 6080 | AK ERO 6070 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Interface | 1 VPP | TTL x 5 | TTL x 10 | TTL x 50 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Reference mark signal | Square-wave pulse | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Integrated interpolation Scanning head AK ERO 6080 AK ERO 6070 Interface 1 VPP TTL x 5 TTL x 10 TTL x 50 Reference mark signal Square-wave pulse Integrated interpolation* – 5-fold 10-fold 50-fold Cutoff frequency –3 dB ? 200 kHz – – – Scanning frequency – ? 200 kHz ? 100 kHz ? 25 kHz Edge separation a – ? 0.220 µs ? 0.220 µs ? 0.175 µs Electrical connection 3 m cable with 15-pin D-sub connector (male); on ERO 6070 interface electronics in the connector Cable length ? 30 m Voltage supply DC 5 V ±0.25 V Current consumption < 100 mA (without load) < 200 mA (without load) Vibration 55 to 2000 Hz Shock 6 ms ? 200 m/s2 (EN 60 068-2-6) ? 500 m/s2 (EN 60 068-2-27) Operating temperature 0 °C to 50 °C (32 °F to 122 °F) Mass Scanning head Connector Cable ? 6 g (without cable) ? 32 g ? 22 g/m ? 6 g (without cable) ? 140 g ? 22 g/m Circular scale TKN ERO 6000 Measuring standard METALLUR graduation on glass Signal periods* 9000 18 000 Accuracy of graduation ±5” ±3.5” Interpolation error per signal period1) ±2” ±1” Reference marks One Hub inside diameter 25 mm 95 mm Circular scale outside diameter 71 mm 150 mm Mech. permissible speed ? 1600 rpm ? 800 rpm Moment of inertia 44 x 10-6 kgm2 1.1 x 10-3 kgm2 Permissible axial motion ? 0.1 mm Protection EN 60 529 Complete encoder in mounted condition: IP00 Mass ? 84 g ? 323 g * Please select when ordering 1) Interpolation error within one signal period and the accuracy of the graduation together result in the encoder-specific error; for additional error from mounting and bearing of the measured shaft, see Measuring accuracy |